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连接温度对Ti为中间层钨/铜合金扩散接头组织和强度的影响
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Effect of Bonding Temperature on Microstructure and Strength of W/CuCrZr Alloy Joints Diffusion Bonded with a Ti Interlayer
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    摘要:

    选取Ti箔作为钨与铜合金(CuCrZr)连接的中间层,考察了连接温度对扩散连接接头的显微结构和强度性能的影响。结果表明:扩散层中脆性金属间化合物对接头强度有重要影响,当连接温度为1030 ℃时,Ti与Cu发生共晶反应全部转化为液相并且大部分被挤出连接区域,少量残留的金属间化合物促进接头强度提高,剪切强度甚至超过W母材。

    Abstract:

    Ti interlayer was selected for the bonding of tungsten to CuCrZr alloy. The effects of bonding temperature on the microstructures and shear strength of the joints were investigated. The results show that the brittle intermetallic compound of diffusion layers significantly effect the strength of the joint. The molten is formed due to eutectic reaction between Ti and Cu at 1030 °C, most part of the molten is extruded out from the bonding zone, where a little amount of intermetallic compound is remained in the interfacial layer, resulting in increasing of joint strength. The shearing strength of the joint is even higher than that of W substrate.

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李 军,杨建锋,乔冠军.连接温度对Ti为中间层钨/铜合金扩散接头组织和强度的影响[J].稀有金属材料与工程,2012,41(7):1235~1238.[Li Jun, Yang Jianfeng, Qiao Guagjun. Effect of Bonding Temperature on Microstructure and Strength of W/CuCrZr Alloy Joints Diffusion Bonded with a Ti Interlayer[J]. Rare Metal Materials and Engineering,2012,41(7):1235~1238.]
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  • 收稿日期:2011-07-25
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