The effects of single-layer and double-layer scanning strategies and energy density (246–640 J/mm³) on the microstructures and mechanical properties of Ta prepared by selective laser melting (SLM) were investigated. The microstructure of SLM-processed Ta was characterized by scanning electron microscope and electron backscatter diffractometer. The microhardness and tensile properties were also tested. Results show that the Ta microstructure is composed of columnar crystals with obviously upward growth trend and the Ta prepared by double-layer scanning has finer grain size. With increasing the input energy density, the strength, microhardness, and ductility of the as-built Ta are significantly improved. In addition, the double-layer scanning strategy can further improve the densification of Ta specimen, and even increases the ductility without strength loss. When the energy density is 640 J/mm³ (double-layer scanning), the as-built Ta exhibits optimal properties: the microhardness, ultimate tensile strength, and elongation are 2307 MPa, 527 MPa, and 11.4%, respectively.