Diffraction geometry of Seemann-Bohlin focusing Guinier film camera and the general principle of determing film stress and lattice constant simutaneously by this camera are described. Its design chart is also given. Taking Nb3Ge superconducting film sample for example, the paper has illustrated the determination procedure in details.
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王超群.薄膜应力和点阵常数同时测定的S-B聚焦Guinier相机[J].稀有金属材料与工程,1992,(6).[Wang Chaoqun. S-B Focusing Guinier Camera for Concurrent Determing Film Stress and Lattice Constant[J]. Rare Metal Materials and Engineering,1992,(6).] DOI：[doi]