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射频磁控溅射制备TiO2光催化薄膜的表征
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TG146.4

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NationalFoundationofNaturalScience(59982002),theBeijingNovaProgram(H020821250190)


Characterization of TiO2 Photocatalytic Thin Films Prepared by Radiofrequency Sputtering
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    摘要:

    在不同的Ar和O2气流量比下,利用射频磁控溅射技术在载波片上制备了TiO2薄膜。利用X射线衍射(XRD),原子力显微镜(AFM),拉曼光谱和UV-VIS-NIR分光光度计等技术对薄膜进行了表征。结果表明在Ar:O2=20sccm:5sccm下制备的薄膜具有较高的光催化活性。

    Abstract:

    TiO2 thin films were prepared on microscope glass slides by radiofrequency magnetron sputtering method under different flow ratios of Ar and O2 gases. The films were characterized by X-ray diffraction (XRD), atomic force microscope (AFM), Raman spectroscopy and UV-VIS spectrophotometer. The results indicated that the film prepared under the flow ratio of ArO2=20 sccm5 sccm has a higher photocatalytic activity.

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郑树凯 郝维昌 潘峰 张俊英 王天民.射频磁控溅射制备TiO2光催化薄膜的表征[J].稀有金属材料与工程,2004,33(7):752~754.[Zheng Shukai, Hao Weichang, Pan Feng, Zhang Junyeng, Wang Tianmin. Characterization of TiO2 Photocatalytic Thin Films Prepared by Radiofrequency Sputtering[J]. Rare Metal Materials and Engineering,2004,33(7):752~754.]
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