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Study on X7R Dielectric Material for Thick Film EMI Filter
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TQ174.758 TN713

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[Li Lingxia, Guo Wei, Wu Xiawan, Wang Hongru, Zhang Zhiping, Yu Haoming. Study on X7R Dielectric Material for Thick Film EMI Filter[J]. Rare Metal Materials and Engineering,2005,34(5):764~767.]
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  • Revised:April 19,2004
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