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The Effect of N2 Partial Pressure on the Microstructure and Properties of Nb-Si-N Films
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TG146.4

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    Abstract:

    The Nb-Si-N films were deposited by reactive magnetron sputtering with different N2 partial pressures. The result showed that the composition, microstructure and properties of the Nb-Si-N films depend strongly on the N2 partial pressure. As the N2 partial pressure increasing, the Nb/Si ratio and the surface roughness decease, but the bulk resistance and microhardness of the Nb-Si-N films increase. The microstructure of Nb-Si-N films is a nano-composite structure consisting of nano-sized NbN crystallites and amorphous Si3N4-like compound of Si-N. With the increase of N2 partial pressure, the amorphous tendency of Nb-Si-N films increases and the grain size decreases.

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[Wang Jianfeng, Song Zhongxiao, Xu Kewei, Fan Duowang. The Effect of N2 Partial Pressure on the Microstructure and Properties of Nb-Si-N Films[J]. Rare Metal Materials and Engineering,2006,35(6):978~981.]
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  • Received:July 12,2005
  • Revised:July 12,2005
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