The microstructure and grain orientation of the high-purity tungsten prepared by a CVD method (CVD-W) were analyzed by optical microscope (OM), X-ray diffraction (XRD) and electron backscatter ring diffraction (EBSD) in a scanning electron microscopy (SEM). The dynamic and static mechanical performances were tested by Hopkinson split-bar and electron testing machinery. Results show that the CVD-W is of columnar-grain microstructure and has (100) texture. The dynamic yield strength of the CVD-W is above 2000 MPa, and the static yield strength is about 1350 MPa. CVD-W has strain-rate sensitivity