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First-Principles Study on Adhesion, Stability, and Electronic Structure of Ir/SiC Interfaces
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Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, Lanzhou 730000, China

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National Natural Science Foundation of China ()

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    Abstract:

    The Ir(111)/SiC(111) interfaces were investigated by first-principles study based on density functional theory (DFT). Considering different stacking sites and terminations, six different interfaces were studied. The results show that an Ir(111) slab with 9 atom layers exhibits bulk-like interior characteristic, while a 12-atom-layer SiC(111) slab represents the properties of bulk SiC. Adhesion and interfacial energy results show that the C-terminated top-site (C-TS) and Si-terminated center-site (Si-CS) interfaces are highly stable with the highest work of adhesion of 6.35 and 6.23 J/m2, and the smallest interfacial energy of 0.07 and 0.10 J/m2 after relaxation, respectively. Electronic structure analysis reveals that the C-TS interface has the ionic characteristics, while the Si-CS interface exhibits covalent bond characteristics. The bonding strength and stability of C-TS and Si-CS interfaces are attributed to the hybridization between Ir-d and C-p, Si-p orbits. Compared with the C-TS interface, sub-interfacial atoms have more interaction with Ir atoms in Si-CS interface.

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[Cheng Gong, Xiong Yuqing, Zhou Hui, Zhang Kaifeng, Gao Hengjiao. First-Principles Study on Adhesion, Stability, and Electronic Structure of Ir/SiC Interfaces[J]. Rare Metal Materials and Engineering,2021,50(5):1569~1575.]
DOI:10.12442/j. issn.1002-185X.20191073

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History
  • Received:December 19,2019
  • Revised:February 03,2020
  • Adopted:February 21,2020
  • Online: July 19,2021
  • Published: May 25,2021