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Effect of Oxygen/Ar Flow Rate Ratio on the Properties of Amorphous Ga2O3 Thin Films on Flexible and Rigid Substrates
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1.Key Laboratory for Physical Electronics and Devices of the Ministry of Education,School of Electronic Science and Engineering,Xi’an Jiaotong University,Xi’an;2.Analytical & Testing Center,Xi’an Jiaotong University,Xi’an

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Research Project of Shenzhen Science and Technology Innovation Committee

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    Abstract:

    In the present work, amorphous Ga2O3 (a-Ga2O3) thin films have been developed on both flexible polyimide(PI), rigid quartz glass and Si substrates via using radio frequency magnetron sputtering at room temperature. The effect of oxygen/Ar flow rate ratio on the structural, optical, surface morphology as well as chemical bonding properties of the a-Ga2O3 films was systematically investigated and elucidated. The average optical transmittance of the a-Ga2O3 films is over 80% from 300 to 2000 nm. The extracted optical band gap of the a-Ga2O3 films increases from 4.97 to 5.13 eV with increasing O2/Ar flow rate ratio from 0 to 0.25, resulting from a suppression of oxygen vacancy defects as increasing O2 partial pressure during growth. Furthermore, the optical refractive index and surface roughness of the a-Ga2O3 films have been optimized while the O2/Ar

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[Yuanjie Li, Yuqing Zhao, Chenyu Liang. Effect of Oxygen/Ar Flow Rate Ratio on the Properties of Amorphous Ga2O3 Thin Films on Flexible and Rigid Substrates[J]. Rare Metal Materials and Engineering,,().]
DOI:10.12442/j. issn.1002-185X.20240726

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History
  • Received:November 07,2024
  • Revised:December 05,2024
  • Adopted:January 03,2025
  • Online: April 03,2025
  • Published: