+Advanced Search
A KUP-T-F Exposure Curve for the Use of Radiographic Examination of Ti with Various Focal Distances
DOI:
Author:
Affiliation:

Clc Number:

TG146.23

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
  • |
  • Comments
    Abstract:

    The principle and method of plotting new kUP (tube voltage)T(thickness of specimen)F(focal distance) exposure curves for the use of radiographic examination of Ti with focal distances of 0412 m are described. The test results show that the method of plotting the kUpTF curve is not only simple, economical and practical, but also good for the image quality of the photographic plate and the photographic efficiency. The curve is also ideal for choosing an accurate value of tube voltage for the onsite radiographic examination of Ti pressure vessels.

    Reference
    Related
    Cited by
Get Citation

[Wei Huiyuan. A KUP-T-F Exposure Curve for the Use of Radiographic Examination of Ti with Various Focal Distances[J]. Rare Metal Materials and Engineering,1999,(3):189~191.]
DOI:[doi]

Copy
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
  • Received:
  • Revised:
  • Adopted:
  • Online:
  • Published: