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Characterization of TiO2 Photocatalytic Thin Films Prepared by Radiofrequency Sputtering
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TG146.4

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    Abstract:

    TiO2 thin films were prepared on microscope glass slides by radiofrequency magnetron sputtering method under different flow ratios of Ar and O2 gases. The films were characterized by X-ray diffraction (XRD), atomic force microscope (AFM), Raman spectroscopy and UV-VIS spectrophotometer. The results indicated that the film prepared under the flow ratio of ArO2=20 sccm5 sccm has a higher photocatalytic activity.

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[Zheng Shukai, Hao Weichang, Pan Feng, Zhang Junyeng, Wang Tianmin. Characterization of TiO2 Photocatalytic Thin Films Prepared by Radiofrequency Sputtering[J]. Rare Metal Materials and Engineering,2004,33(7):752~754.]
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