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Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths
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    Abstract:

    Cu/Ag多层膜;Hall-Petch关系;位错塞积模型;位错稳定性

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[Cao Ke, Ren Fengzhang, Su Juanhua, Zhao Shiyang, Tian Baohong. Analysis of the Hardness for Cu/Ag Multilayers with Various Modulation Wavelengths[J]. Rare Metal Materials and Engineering,2011,40(12):2152~2155.]
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  • Received:December 13,2010
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