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TEM Characterization of Pt+g ¢-Ni3Al+g -Ni/CMSX-4 Coating Microstructure
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    Abstract:

    Pt+g ¢-Ni3Al+g -Ni/CMSX-4 coatings were fabricated by Pt electroplating on CMSX-4 single crystal superalloys substrate and followed by an aluminizing pack cementation process. The microstructure of the Pt+g ¢-Ni3Al+g -Ni/CMSX-4 coating was studied by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). TEM investigation showed that {111} twinning exists in the g ¢-Ni3Al phase, Pt was mainly distributed in the g ¢-Ni3Al. Precipitates were observed in the coatings. Selected area electron diffraction (SAED) reveals that the precipitate was the hexagonal topologically close-packed (TCP) m phase with lattice parameters a=0.473 nm, and c=2.565 nm. Twin domains parallel to (001) and (10

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[Cao Guanghui, Yao Peipei, Russell Alan M. TEM Characterization of Pt+g ¢-Ni3Al+g -Ni/CMSX-4 Coating Microstructure[J]. Rare Metal Materials and Engineering,2012,41(5):847~850.]
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  • Received:May 12,2011
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